{"id":2062,"date":"2024-01-12T06:02:02","date_gmt":"2024-01-12T06:02:02","guid":{"rendered":"https:\/\/35.94.173.37\/blog\/?p=2062"},"modified":"2024-11-12T05:31:26","modified_gmt":"2024-11-12T05:31:26","slug":"automating-asic-testing-a-case-study-in-production-efficiency","status":"publish","type":"post","link":"https:\/\/www.apexwaves.com\/blog\/automating-asic-testing-a-case-study-in-production-efficiency\/","title":{"rendered":"Automating ASIC Testing: A Case Study in Production Efficiency"},"content":{"rendered":"

In the ever-evolving landscape of semiconductor technology, the challenges of simplifying production tests and minimizing costs are paramount. A case study showcasing ideas from Concept Technologies- with the help of tools from NI and Konrad Technologies- offers a groundbreaking solution to these challenges. This case study demonstrates how automation and cutting-edge technology transformed the testing process of application-specific integrated circuits (ASICs).<\/p>\n

The Challenge: Streamlining ASIC Production Tests<\/strong><\/h2>\n

The initial hurdle was clear: simplify the production test process and eliminate the costly need for resoldering failed\u00a0ASICs\u00a0<\/strong>post-product testing. Traditional methods often involved labor-intensive processes and incurred additional expenses due to the rework required after tests.<\/p>\n

\"Extreme<\/figure>\n

The Solution: Automation and Next-Gen Technology Integration<\/strong><\/h3>\n

Enter the solution \u2013 a strategic combination of NI hardware and software with\u00a0Konrad Technologies\u2019 KT-7500 Mixed-Signal Tester<\/strong>, working seamlessly alongside a\u00a0Multitest MT9928<\/strong>\u00a0gravity test handler. The centerpiece of this transformation was the SCALE-2 chipset from CONCEPT, a next-gen platform designed for scalable insulated gate bipolar transistors (IGBT) and power metal-oxide semiconductor field-effect transistors (MOSFET) gate drivers.<\/p>\n

The\u00a0SCALE-2\u00a0<\/strong>chipset brought forth significant advancements in dynamic performance, accuracy, functionality, flexibility, and time to market. Leveraging the proven CONCEPT SCALE driver methodology, the design showcased state-of-the-art analog capabilities and a moderate digital feature size, resulting in an optimum cost-performance ratio.<\/p>\n

\"Angled<\/figure>\n

The successful implementation of this solution involved a carefully selected set of hardware components, including the\u00a0KT-ABex base system<\/strong>,\u00a0NI PXI-1045<\/strong><\/a>\u00a0chassis,\u00a0NI PXI-5122<\/a><\/strong>\u00a0high-resolution digitizer,\u00a0NI PXI-4132<\/a><\/strong>\u00a0source measure unit, and Konrad Technologies DIG50IO with an\u00a0NI PXI-7952R<\/a><\/strong>\u00a0FlexRIO module. The software components were equally vital, featuring NI LabVIEW system design software, NI TestStand software, and Konrad KT-STAT for statistical analysis and evaluation.<\/p>\n

System Development and Design: Precision and Innovation<\/strong><\/h3>\n

The development phase saw the creation of a meticulously designed six-layer printed circuit board (PCB) in-house. Gold-plated contacts ensured minimal contact resistance to the KT-ABex test system. Safety measures, such as the use of antiserial Transil zener diodes, were implemented to guarantee voltages below 17 V for the high-speed DIG50IO field-programmable gate array (FPGA) card.<\/p>\n

The\u00a0DIG50IO Mixed-Signal Module<\/strong>, based on\u00a0NI FlexRIO<\/strong>, played a pivotal role in the testing process. With 20 bidirectional channels, programmable levels, and high-speed patterns, it provided the versatility needed for rigorous ASIC testing.<\/p>\n

\"Black
Integrated circuits on a circuit board<\/em><\/figcaption><\/figure>\n

The testing process involved running high-speed patterns, supplied by Konrad Technologies, and loading them onto the FPGA using\u00a0NI TestStand<\/strong>.\u00a0LabVIEW\u00a0<\/strong>was instrumental in examining and evaluating the waveform according to the given ASIC chipset specifications. Result evaluation was further enhanced with Konrad Technologies KT-STAT software, offering a comprehensive view of accumulated measurement results in KT result format.<\/p>\n

This case study exemplifies a paradigm shift in\u00a0ASIC\u00a0<\/strong>testing, showcasing how automation, next-gen technology, and meticulous system design can significantly enhance production efficiency. The successful integration of\u00a0NI hardware and software<\/strong>, alongside Konrad Technologies\u2019 expertise, not only addressed the initial challenge but also set a new standard for streamlined and cost-effective ASIC testing in the semiconductor industry.<\/p>\n

The case study described in this blog post was originally authored by Sam Gasser from Concept Technologie AG.<\/em><\/p>\n","protected":false},"excerpt":{"rendered":"

In the ever-evolving landscape of semiconductor technology, the challenges of simplifying production tests and minimizing costs are paramount. A case study showcasing ideas from Concept Technologies- with the help of tools from NI and Konrad Technologies- offers a groundbreaking solution to these challenges. This case study demonstrates how automation and cutting-edge technology transformed the testing […]<\/p>\n","protected":false},"author":1,"featured_media":2810,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"_acf_changed":false,"footnotes":""},"categories":[12,3],"tags":[66,242,255,318,393,437,574,910,921],"class_list":["post-2062","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-case-study","category-circuits","tag-asic","tag-flexrio","tag-fpga","tag-labview","tag-national-instruments","tag-ni","tag-pxi","tag-technology","tag-test-equipment"],"acf":[],"_links":{"self":[{"href":"https:\/\/www.apexwaves.com\/blog\/wp-json\/wp\/v2\/posts\/2062","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.apexwaves.com\/blog\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/www.apexwaves.com\/blog\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/www.apexwaves.com\/blog\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/www.apexwaves.com\/blog\/wp-json\/wp\/v2\/comments?post=2062"}],"version-history":[{"count":1,"href":"https:\/\/www.apexwaves.com\/blog\/wp-json\/wp\/v2\/posts\/2062\/revisions"}],"predecessor-version":[{"id":2067,"href":"https:\/\/www.apexwaves.com\/blog\/wp-json\/wp\/v2\/posts\/2062\/revisions\/2067"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/www.apexwaves.com\/blog\/wp-json\/wp\/v2\/media\/2810"}],"wp:attachment":[{"href":"https:\/\/www.apexwaves.com\/blog\/wp-json\/wp\/v2\/media?parent=2062"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/www.apexwaves.com\/blog\/wp-json\/wp\/v2\/categories?post=2062"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.apexwaves.com\/blog\/wp-json\/wp\/v2\/tags?post=2062"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}