Anonymous Verified Buyer
" Very responsive and helpful, competitive pricing. Good source! "
July 2025
SET-3000
SET-3000, High-Density, Modular Architecture, Semiconductor Test System
Actual item may vary if no part number is provided on quote request.
✔ 2 Year Warranty Included
✔ Free Domestic Ground Shipping
✔ NIST Calibration Available
Andrew Gar**** Verified Buyer
" Amazing to work with and had my order within 1 week after purchasing with all NI certs and data that were needed. "
March 2025
Said Sai**** Verified Buyer
" Competent contact for highly specialized components. The support team is very knowledgeable. Many thanks for the help and the fast shipping! "
January 2025
Bob C**** Verified Buyer
" Jason was able to get our emergency situation taken care of quickly and professionally. "
May 2025
Gregg Flecki**** Verified Buyer
" Great service and great products. This is my 2nd time using Apex Waves, truly impressed. "
January 2025
Carol Zimme**** Verified Buyer
" Very responsive and helpful, competitive pricing. Good source! "
July 2025
Andrew Gar**** Verified Buyer
" Amazing to work with and had my order within 1 week after purchasing with all NI certs and data that were needed. "
March 2025
Said Sai**** Verified Buyer
" Competent contact for highly specialized components. The support team is very knowledgeable. Many thanks for the help and the fast shipping! "
January 2025
Bob C**** Verified Buyer
" Jason was able to get our emergency situation taken care of quickly and professionally. "
May 2025
Gregg Flecki**** Verified Buyer
" Great service and great products. This is my 2nd time using Apex Waves, truly impressed. "
January 2025
National Instruments SET-3000 Semiconductor Test System
The National Instruments SET-3000 is an advanced hardware platform tailored for semiconductor testing applications, specifically designed to perform fault insertion and signal simulation with high precision. The SET-3000 integrates into HiL test environments and allows fault conditions like open-circuit and short-circuit situations. This makes the SET-3000 an essential component within such areas as automotive and aerospace industries, which demand a very high level of testing procedures where faultless safety and dependability for the electronic component must be ensured.
The SET-3000 is based on a modular PXI platform developed by National Instruments and hence offers scalability and flexibility in semiconductor test systems. Equipped with high-density fault insertion modules, the SET-3000 allows the engineer to simulate complex fault scenarios with the retention of precise signal integrity. Most importantly, the SET-3000 addresses production test applications where speed and repeatability are of paramount importance, enabling the manufacturer to quickly find and eliminate prospective device failures throughout the production cycle.
The SET-3000 grants ease of integration with industry-standard software like LabVIEW and TestStand, adding flexibility in automated test systems. Equipped with programmable fault conditions, the SET-3000 ensures that digital and analog signals are thoroughly tested for performance under a variety of fault conditions, hence becoming an essential tool in device performance analysis. Modularity within the SET-3000 allows easy upgrades to address changing test requirements and enables long-term usability in multiple applications.
Besides its fault stimulation capabilities, the SET-3000 demonstrates extraordinary performance in real-time data acquisition and high-speed signal processing. Such features make the SET-3000 a reliable solution for a semiconductor production line where the least amount of downtime and consistency maintenance is of prime importance. The compact design and energy efficiency of the SET-3000 further enhance its suitability for application in laboratories and manufacturing processes where there are often highly imposing constraints on space and power.
| Model | SET-3000 |
|---|---|
| Part Type | Semiconductor Test System |
| Operating Humidity | 10%-90% Relative, Non-Condensing |
| Storage Humidity | 5%-95% Relative, Non-Condensing |
| Operating Temperature | 0°C to 40°C (Forced-Air Cooling) |
| Storage Temperature | -40°C to 85°C |
| Maximum Altitude | 2000 meters above sea level |
| Fault Simulation | Open/Short Circuits, Pin-to-Pin Shorts |
| Software Integration | Compatible with LabVIEW and TestStand |
| Channel Density | High-density modular PXI architecture |
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