National Instruments cDAQ-9188 CompactDAQ Chassis

The cDAQ-9188 (Part Numbers: 781424-01 and 782824-01) CompactDAQ Chassis allows the user to utilize DAC to produce a waveform, so they may see glitches on the output signal. These glitches are ordinary; glitches will be produced from discharged rates, when a DAC changes starting with one voltage then onto the next. The biggest glitches happen when the most noteworthy piece of the DAC code changes. The user can construct a low-pass deglitching channel to evacuate a portion of these glitches, contingent upon the frequency and nature of the output signal. Each of the DIO lines can be used as either a static DI or DO line. The user can utilize static DIO lines to screen or control advanced signals on some C Series modules. Each DIO line can be exclusively designed to advanced information (DI) or computerized yield (DO), if the C Series module being utilized permits such a setup. The user can gain advanced waveforms utilizing either parallel or serial computerized modules. The DI waveform securing FIFO stores the computerized tests. The NI cDAQ-9188 suspension tests the DIO lines on each rising or falling edge of the DI Sample Clock flag.

The user can utilize the DI Sample Clock (di/SampleClock) signal to test computerized I/O on any space using parallel advanced modules and store the outcome in the waveform procurement FIFO. If the CompactDAQ Chassis gets a DI Sample Clock flag when the FIFO is full, it reports a flood blunder to the host programming.