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National Instruments PXIe-4163 PXI Source Measure Unit

National Instruments developed the high-precision source measure unit (SMU) PXIe-4163 (Part Numbers: 784483-01, 784483-02, 140185D-01L) for use in semiconductor manufacturing test applications. With 24 identical SMU channels that provide 4-quadrant operation and integrated remote sensing for accurate measurements, it is rather impressive. With its built-in analog-to-digital converter, it makes it easier to do high-precision measurements that are necessary for testing mixed-signal integrated circuits (ICs).

One of its unique features is SourceAdapt technology, which matches load parameters to adjust transient response, maximizing stability and measurement accuracy. This boosts overall productivity by guaranteeing dependable performance across a range of testing scenarios. The PXIe-4163 provides versatility to meet a multitude of testing requirements because to its broad DC voltage range of ±24 V. Accurate measurements are guaranteed by its sample rate accuracy of ±50 ppm, and effective data capture is made possible by its remarkable maximum measure rate of 100,000 S/s per channel.

With support for Start, Source, Sequence Advance, and Measure triggers among others, the module allows for flexibility in test sequencing. For synchronization with external devices, it also offers output triggers like Source Complete and Measure Complete. To ensure steady and dependable performance over time, the PXIe-4163 recommends calibrating at an annual interval. Because of its small 3U, one-slot design, it can be integrated into PXI Express/CompactPCI Express systems and save a lot of rack space. With proper chassis cooling and operating temperature ranges of 0°C to 55°C, dependable performance is guaranteed even in harsh conditions. Rugged design ensures longevity in industrial environments by withstanding operational vibration up to 0.3 g RMS and non-operating vibration up to 2.4 g RMS.